THE ROLE :
Be a member of the team that plays a significant role in ensuring the quality of next generation microprocessors through structured DFT, Automatic Test Pattern Generation (ATPG) and Logic Built-In Self-Test (LBIST) techniques.
Key responsibilities :
Collaborating with the design teams to ensure DFT design rules and guidelines are met
Desired profile - The candidate must have detailed knowledge of DFT basics such as scan insertion, fault models, ATPG, BIST techniques, and on-chip compression techniques that reduce test time and tester memory.
Experience with test tools such as FastScan and TestKompress is highly desirable.Scan / ATPG, knowledge of industry standard DFT features, simulation debug, MBIST
Academic credentials :